Как известно из метрологии, погрешн

Как известно из метрологии, погрешности любого измерения классифицируется на систематическую (bias) и случайную (noise). Систематическую погрешность сравнительно легко исправить путём введения коррекции на основании анализа исторических данных и аналитических расчётов. Наиболее вероятные источники систематической погрешности в плановых показателях рассмотрены ниже. Уменьшить случайную погрешность можно, используя современные приёмы планирования (которые в деталях описывает консалтинговая компания).

Результаты (английский) 1:

As we know from the Metrology of error any dimension is classified on a systematic (bias) and random (noise). Systematic error of relatively easily remedied by introducing a correction based on analysis of historical data and analytical calculations. The most likely sources of systematic error in targets discussed below. Reduce the random error is possible, using modern methods of planning (which describes in detail the consulting company).

Результаты (английский) 2:

As is known from metrology accuracy of any measurement is classified into systematic (bias) and random (noise). Systematic errors are relatively easy to rectify by introducing a correction based on an analysis of historical data and analytical calculations. The most likely sources of bias in the planned indicators discussed below. Reduce the random error is possible, using modern planning techniques (which in detail describes the consulting company).

Результаты (английский) 3:

it is known from the metrology, errors of any dimension is classified in a systematic (bias) and random (noise). the systematic error is relatively easy to fix by the introduction of correction on the basis of the analysis of historical data and analytical calculations. the most likely sources of systematic errors in planning indicators discussed below. to reduce the random error is possible, using modern techniques of planning (which in detail describes the consulting company).